Corelis Introduces High-Performance Boundary-Scan - JTAG - Test Support for Semiconductor, SOC and ASIC Testers
WGL Remote Diagnostics 1.0 Extends Corelis' High-Performance
Boundary-Scan Testing to Semiconductor Testers
CERRITOS, Calif.—(BUSINESS WIRE)—Nov. 17, 2004—
Corelis, Inc. today introduced the test industry's first
boundary-scan (JTAG) tools that enable customers to port boundary-scan
tests to semiconductor testers and remotely diagnose test results on a
networked PC. WGL (Waveform Generation Language) Remote Diagnostics
1.0 enables users to review and diagnose boundary-scan test results
downloaded from a standalone chip tester on a remote PC, thereby
reducing costly usage fees on expensive testers. Using Corelis' WGL
Remote Diagnostic 1.0 software, high performance boundary-scan test
vectors developed with Corelis' ScanExpressTPG Automatic Test Pattern
Generator can be ported to, and executed on, third party IC test
platforms such as semiconductor testers, SOC and ASIC testers and
functional testers.
WGL Remote Diagnostics 1.0 reduces the high cost to users of
operating expensive chip testers by diagnosing boundary-scan faults
off-line on a remote PC. This product was designed to meet the needs
of engineers designing complex multi-chip modules (MCM) who use the
WGL format to run test vectors on the Agilent 83K, Agilent 93K and
other testers as well as engineers who use semiconductor testers to
qualify boundary-scan compatible devices.
"Our WGL Remote Diagnostics 1.0 minimizes expensive semiconductor
tester use time while providing essential boundary-scan test results
in the user-friendly format similar to our industry-leading ScanPlus
Runner product," said Carmy Yellin, Vice President of Technology for
Corelis. "Our boundary-scan tests are easy to produce and are widely
accepted by many customers who also develop their own ASICs. Running
boundary-scan tests in conjunction with the native tests of a
semiconductor tester provide a new level of diagnostic visibility to
our customers."
Additional features of WGL Remote Diagnostics 1.0 include the
ability to edit test vectors which are otherwise inaccessible to the
user as well as the ability to perform custom boundary-scan operations
and simulate abnormal waveform situations. Also, WGL Remote
Diagnostics 1.0 provides engineers a way to diagnose difficulties with
non-conforming devices, fix them and successfully scan them using
edited test vectors.
The WGL Remote Diagnostics v1.0 CD-ROM is now available for
customer installation and is compatible with the Corelis ScanPlusTPG
and ScanExpressTPG boundary-scan test generation tools.
Corelis Inc. offers a broad line of boundary-scan software and
hardware products that combine exceptional ease-of-use with advanced
technical innovation. Corelis' ScanPlus and ScanExpress Boundary-Scan
systems are used for interconnect testing as well as in-system
programming of Flash memories, CPLDs and FPGAs. Corelis' systems
include a complete range of IEEE-1149.1-compatible boundary-scan
testers for PCI, PC-Card, 10/100 LAN, USB 2.0, cPCI/cPXI, PC Card and
VXI host interfaces. Corelis also offers a full-line of JTAG emulation
and debugging tools. Corelis provides custom test engineering services
and is well known for its outstanding customer support.
Contact:
Corelis, Inc.
Terri Martinez, 562-926-6727
Terri.martinez@corelis.com
